Eklow, B.: search on Z-Library

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1

IEEE 1149.6: a boundary-scan standard for advanced digital networks

Eklow, B., Parker, K.P., Barnhart, C.F.

Journal:

IEEE Design & Test of Computers

Year:

2003

Language:

english

File:

PDF, 265 KB

english, 2003

2

[IEEE IEEE International Conference on Test, 2005. - Charlotte, NC, USA (Nov. 8, 2005)] IEEE International Conference on Test, 2005. - IJTAG (Internal JTAG): A Step Toward a DFT Standard

Rearick, J., Eklow, B., Posse, K., Crouch, A., Bennetts, B.

Year:

2005

Language:

english

File:

PDF, 378 KB

english, 2005

3

[IEEE 2014 IEEE International Test Conference (ITC) - Seattle, WA, USA (2014.10.20-2014.10.23)] 2014 International Test Conference - Protecting against emerging vmin failures in advanced technology nodes

Lee, J. K. Jerry, Haggag, Amr, Eklow, William

Year:

2014

Language:

english

File:

PDF, 985 KB

english, 2014

4

[ACM Press the 50th Annual Design Automation Conference - Austin, Texas (2013.05.29-2013.06.07)] Proceedings of the 50th Annual Design Automation Conference on - DAC '13 - On effective and efficient in-field TSV repair for stacked 3D ICs

Jiang, Li, Ye, Fangming, Xu, Qiang, Chakrabarty, Krishnendu, Eklow, Bill

Year:

2013

Language:

english

File:

PDF, 425 KB

english, 2013

5

[IEEE Eleventh IEEE European Test Symposium (ETS'06) - Southampton, UK (21-21 May 2006)] Eleventh IEEE European Test Symposium (ETS'06) - New Techniques for Accessing Embedded Instrumentation: IEEE P1687 (IJTAG)

Eklow, B., Bennetts, B.

Year:

2006

Language:

english

File:

PDF, 87 KB

english, 2006

6

Major Milestones for Two IEEE Standards Groups in 2011

Journal:

IEEE Design & Test of Computers

Year:

2011

Language:

english

File:

PDF, 447 KB

english, 2011

7

[IEEE 2012 14th International Conference on Electronic Materials and Packaging (EMAP) - Lantau Island, Hong Kong (2012.12.13-2012.12.16)] 2012 14th International Conference on Electronic Materials and Packaging (EMAP) - Through Silicon Via (TSV) redundancy - a high reliability, networking product perspective

Poh Choon Chew,, Li Li,, Jie Xue,, Eklow, William

Year:

2012

Language:

english

File:

PDF, 475 KB

english, 2012

8

Alterations in intracellular thiol homeostasis during the metabolism of menadione by isolated rat hepatocytes

Donato Di Monte, David Ross, Giorgio Bellomo, Lena Eklöw, Sten Orrenius

Journal:

Archives of Biochemistry and Biophysics

Year:

1984

Language:

english

File:

PDF, 822 KB

english, 1984

9

Metabolism of hydrogen peroxide in isolated hepatocytes: Relative contributions of catalase and glutathione peroxidase in decomposition of endogenously generated H2O2

Dean P. Jones, Lena Eklöw, Hjördis Thor, Sten Orrenius

Journal:

Archives of Biochemistry and Biophysics

Year:

1981

Language:

english

File:

PDF, 1.00 MB

english, 1981

10

[IEEE 2006 IEEE International Test Conference - Santa Clara, CA, USA (2006.10.22-2006.10.27)] 2006 IEEE International Test Conference - IEEE P1687: Toward Standardized Access of Embedded Instrumentation

Posse, Ken, Crouch, Al, Rearick, Jeff, Eklow, Bill, Laisne, Mike, Bennetts, Ben, Doege, Jason, Ricchetti, Mike, Cote, J-f

Year:

2006

Language:

english

File:

PDF, 9.88 MB

english, 2006

11

[IEEE IEEE International Conference on Test, 2005. - Charlotte, NC, USA (Nov. 8, 2005)] IEEE International Conference on Test, 2005. - A practical perspective on reducing ASIC NTFs

Conroy, Z., Richmond, G., Xinli Gu,, Eklow, B.

Year:

2005

Language:

english

File:

PDF, 229 KB

english, 2005

12

[IEEE Comput. Soc . Design, Automation and Test in Europe Conference and Exhibition - Paris, France (16-20 Feb. 2004)] Proceedings. Design, Automation and Test in Europe Conference and Exhibition - IP testing - the future differentiator?

Year:

2004

Language:

english

File:

PDF, 182 KB

english, 2004

13

[IEEE International Test Conference 2004 - Charlotte, NC, USA (26-28 Oct. 2004)] 2004 International Conferce on Test - Simulation based system level fault insertion using co-verification tools

Eklow, B., Hosseini, A., Chi Khuong,, Pullela, S., Vo, T., Chau, H.

Year:

2004

Language:

english

File:

PDF, 384 KB

english, 2004

14

[IEEE 2008 IEEE International Test Conference - Santa Clara, CA (2008.10.28-2008.10.30)] 2008 IEEE International Test Conference - Embedded Testing in an In-Circuit Test Environment

Malian, J., Eklow, B.

Year:

2008

Language:

english

File:

PDF, 347 KB

english, 2008

15

[IEEE International Test Conference 2004 - Charlotte, NC, USA (26-28 Oct. 2004)] 2004 International Conferce on Test - What do you mean my board test stinks?

Year:

2004

Language:

english

File:

PDF, 69 KB

english, 2004

16

Dielectronic recombination resonances in

Tokman, M., Eklöw, N., Glans, P., Lindroth, E., Schuch, R., Gwinner, G., Schwalm, D., Wolf, A., Hoffknecht, A., Müller, A., Schippers, S.

Journal:

Physical Review A

Year:

2002

Language:

english

File:

PDF, 197 KB

english, 2002

17

[IEEE 2002 International Test Conference - Baltimore, MD, USA (7-10 Oct. 2002)] Proceedings. International Test Conference - Is board test worth talking about?

Year:

2002

Language:

english

File:

PDF, 74 KB

english, 2002

18

Dielectronic recombination of Li-like fluorine ions

P. Glans, E. Lindroth, N. Eklöw, W. Zong, G. Gwinner, A.A. Saghiri, M. Pajek, H. Danared, R. Schuch

Journal:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Year:

1999

Language:

english

File:

PDF, 118 KB

english, 1999

19

Scan-Based Testing of Post-Bond Silicon Interposer Interconnects in 2.5-D ICs

Wang, Ran, Chakrabarty, Krishnendu, Eklow, Bill

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2014

Language:

english

File:

PDF, 3.30 MB

english, 2014

20

[IEEE 2002 International Test Conference - Baltimore, MD, USA (7-10 Oct. 2002)] Proceedings. International Test Conference - IEEE P1149.6: a boundary-scan standard for advanced digital networks

Eklow, B., Barnhart, C.F., Parker, K.

Year:

2002

Language:

english

File:

PDF, 491 KB

english, 2002

21

Managing Complex Boundary-Scan Operations

Journal:

IEEE Design & Test of Computers

Year:

2012

Language:

english

File:

PDF, 76 KB

english, 2012

22

[IEEE 2012 17th Asia and South Pacific Design Automation Conference (ASP-DAC) - Sydney, Australia (2012.01.30-2012.02.2)] 17th Asia and South Pacific Design Automation Conference - Yield enhancement for 3D-stacked ICs: Recent advances and challenges

Xu, Qiang, Jiang, Li, Huiyun Li,, Eklow, Bill

Year:

2012

Language:

english

File:

PDF, 116 KB

english, 2012

23

[IEEE International Test Conference 2004 - Charlotte, NC, USA (26-28 Oct. 2004)] 2004 International Conferce on Test - "Real life" system testing of networking equipment

Kalidindi, S., Huynh, N., Eklow, B., Goldstein, J.

Year:

2004

Language:

english

File:

PDF, 499 KB

english, 2004

24

[IEEE 2015 IEEE 33rd VLSI Test Symposium (VTS) - Napa, CA, USA (2015.4.27-2015.4.29)] 2015 IEEE 33rd VLSI Test Symposium (VTS) - No Fault Found: The root cause

Larsson, Erik, Eklow, Bill, Davidsson, Scott, Aitken, Rob, Jutman, Artur, Lotz, Christophe

Year:

2015

Language:

english

File:

PDF, 103 KB

english, 2015

25

Measurement of the field-induced dielectronic recombination rate enhancement of N4+ ions differential in the Rydberg quantum number n

S. Böhm, A. Müller, S. Schippers, W. Shi, H. Danared, N. Eklöw, M. Fogel, R. Schuch, N. Djurić, G.H. Dunn, K.B. MacAdam

Journal:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Year:

2003

Language:

english

File:

PDF, 194 KB

english, 2003

26

Dielectronic recombination of N^{4+}

Glans, P., Lindroth, E., Badnell, N., Eklöw, N., Zong, W., Justiniano, E., Schuch, R.

Journal:

Physical Review A

Year:

2001

Language:

english

File:

PDF, 138 KB

english, 2001

27

ions differential in the Rydberg quantum number n

Böhm, S., Schippers, S., Shi, W., Müller, A., Eklöw, N., Schuch, R., Danared, H., Badnell, N. R., Mitnik, D. M., Griffin, D. C.

Journal:

Physical Review A

Year:

2002

Language:

english

File:

PDF, 334 KB

english, 2002

28

Cellular distribution of the C-type II lectin dendritic cell immunoreceptor (DCIR) and its expression in the rheumatic joint: identification of a subpopulation of DCIR+ T cells

Eklow, C, Makrygiannakis, D, Backdahl, L, Padyukov, L, Ulfgren, A-K, Lorentzen, J C, Malmstrom, V

Journal:

Annals of the Rheumatic Diseases

Year:

2008

Language:

english

File:

PDF, 1.91 MB

english, 2008

29

Effects of Oxidative Stress Caused by Hyperoxia and Diquat. A Study in Isolated Hepatocytes

Eklöw-Låstbom, Lena, Rossi, Luisa, Thor, Hjördis, Orrenius, Sten

Journal:

Free Radical Research

Year:

1986

Language:

english

File:

PDF, 660 KB

english, 1986

30

[Int. Test Conference International Test Conference - Washington, DC, USA (2-6 Oct. 1994)] Proceedings., International Test Conference - Optimizing boundary scan in a proprietary environment

Year:

1994

Language:

english

File:

PDF, 95 KB

english, 1994

31

[IEEE International Test Conference, 2003. ITC 2003. - Charlotte, NC, USA (Sept. 30,-Oct. 2, 2003)] International Test Conference, 2003. Proceedings. ITC 2003. - IEEE 1149.6 - A practical perspective

Eklow, B., Barnhart, C., Ricchetti, M., Borroz, T.

Year:

2003

Language:

english

File:

PDF, 585 KB

english, 2003

32

[IEEE 2014 IEEE 23rd Asian Test Symposium (ATS) - Hangzhou, China (2014.11.16-2014.11.19)] 2014 IEEE 23rd Asian Test Symposium - An All Digital Distributed Sensor Network Based Framework for Continuous Noise Monitoring and Timing Failure Analysis in SoCs

Sadi, Mehdi, Conroy, Zoe, Eklow, Bill, Kamm, Matthias, Bidokhti, Nematollah, Tehranipoor, Mark Mohammad

Year:

2014

Language:

english

File:

PDF, 1.76 MB

english, 2014

33

[IEEE International Test Conference 2004 - Charlotte, NC, USA (26-28 Oct. 2004)] 2004 International Conferce on Test - Realizing high test quality goals with smart test resource usage

Xinli Gu,, Wang, C., Lee, A., Eklow, B., Kun-Han Tsai,, Tofte, J.A., Kassab, M., Rajski, J.

Year:

2004

Language:

english

File:

PDF, 664 KB

english, 2004

34

[IEEE International Test Conference, 2003. ITC 2003. - Washington, DC, USA (Sept. 30-Oct. 2, 2003)] International Test Conference, 2003. Proceedings. ITC 2003. - IEEE 1149.6 - a practical perspective

Eklow, B., Barnhart, C., Ricchetti, M., Borroz, T.

Year:

2003

Language:

english

File:

PDF, 830 KB

english, 2003

35

Influence of Magnetic Fields on Electron-Ion Recombination at Very Low Energies

Gwinner, G., Hoffknecht, A., Bartsch, T., Beutelspacher, M., Eklöw, N., Glans, P., Grieser, M., Krohn, S., Lindroth, E., Müller, A., Saghiri, A. A., Schippers, S., Schramm, U., Schwalm, D., Tokman, M.

Journal:

Physical Review Letters

Year:

2000

Language:

english

File:

PDF, 86 KB

english, 2000

36

Enhancement of Dielectronic Recombination by External Electromagnetic Fields

S. Böhm, S. Schippers, W. Shi, A. Müller, N. Djurić, G. H. Dunn, W. Zong, B. Jelenković, H. Danared, N. Eklöw, P. Glans, R. Schuch, N. R. Badnell

Journal:

Hyperfine Interactions

Year:

2003

Language:

english

File:

PDF, 66 KB

english, 2003

37

Modelling the effect of lactic acid bacteria from starter- and aroma culture on growth of Listeria monocytogenes in cottage cheese

Østergaard, Nina Bjerre, Eklöw, Annelie, Dalgaard, Paw

Journal:

International Journal of Food Microbiology

Year:

2014

Language:

english

File:

PDF, 711 KB

english, 2014

38

[IEEE 2006 IEEE International Test Conference - Santa Clara, CA, USA (2006.10.22-2006.10.27)] 2006 IEEE International Test Conference - Test Economics ¿ What can a Board/System Test Engineer do to Influence Supply Operation Metrics

Tourangeau, Sylvain, Eklow, Bill

Year:

2006

Language:

english

File:

PDF, 278 KB

english, 2006

39

On Effective Through-Silicon Via Repair for 3-D-Stacked ICs

Jiang, Li, Xu, Qiang, Eklow, Bill

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2013

Language:

english

File:

PDF, 9.67 MB

english, 2013

40

QED effects in lithiumlike krypton

Madzunkov, S., Lindroth, E., Eklöw, N., Tokman, M., Paál, A., Schuch, R.

Journal:

Physical Review A

Year:

2002

Language:

english

File:

PDF, 156 KB

english, 2002

41

Differential expression of transcripts for the autoimmunity-related human dendritic cell immunoreceptor

Ronninger, M, Eklöw, C, Lorentzen, J C, Klareskog, L, Padyukov, L

Journal:

Genes and Immunity

Year:

2008

Language:

english

File:

PDF, 257 KB

english, 2008

42

Enumeration and Identification of Lactobacillus paracasei subsp. paracasei F19

Björneholm, Stina, Eklöw, Annelie, Saarela, Maria, Mättö, Jaana

Journal:

Microbial Ecology in Health and Disease

Year:

2002

Language:

english

File:

PDF, 255 KB

english, 2002

43

On the mechanisms of glutathione depletion in hepatocytes exposed to morphine and ethylmorphine

Lena Eklöw-Låstbom, Peter Moldéus, Sten Orrenius

Journal:

Year:

1986

Language:

english

File:

PDF, 464 KB

english, 1986

44

[IEEE 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT) - Chicago, Illinois, USA (2009.10.7-2009.10.9)] 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - An Incremental Approach to Functional Diagnosis

Amati, Luca, Bolchini, Cristiana, Frigerio, Laura, Salice, Fabio, Eklow, William, Suvatne, Arnold, Brambilla, Eugenio, Franzoso, Federico, Martin, Michele

Year:

2009

Language:

english

File:

PDF, 370 KB

english, 2009

45

[IEEE International Test Conference - Baltimore, MD, USA (30 Oct.-1 Nov. 2001)] Proceedings International Test Conference 2001 (Cat. No.01CH37260) - Unsafe board states during PC-based boundary-scan testing

Eklow, B., Sedmak, R., Singletary, D., Vo, T.

Year:

2001

Language:

english

File:

PDF, 778 KB

english, 2001

46

Association of arthritis with a gene complex encoding C-type lectin–like receptors

Johnny C. Lorentzen, Line Flornes, Carina Eklöw, Liselotte Bäckdahl, Ulrica Ribbhammar, Jian Ping Guo, Marina Smolnikova, Erik Dissen, Maria Seddighzadeh, Anthony J. Brookes, Lars Alfredsson, Lars Kla

Journal:

Arthritis & Rheumatism

Year:

2007

Language:

english

File:

PDF, 511 KB

english, 2007

47

[IEEE 2008 IEEE International Test Conference - Santa Clara, CA (2008.10.28-2008.10.30)] 2008 IEEE International Test Conference - Parametric Testing of Optical Interfaces

Achkir, B., Zivny, P., Eklow, B.

Year:

2008

Language:

english

File:

PDF, 33 KB

english, 2008

48

Recap of the ITC15 Test Conference

Journal:

IEEE Design and Test

Year:

2016

Language:

english

File:

PDF, 72 KB

english, 2016

49

Oxidation of glutathione during hydroperoxide metabolism : A study using isolated hepatocytes and the glutathione reductase inhibitor 1,3-bis(2-chloroethyl)-1-nitrosourea

Lena EKLÖW, Peter MOLDÉUS, Sten ORRENIUS

Journal:

Year:

1984

Language:

english

File:

PDF, 556 KB

english, 1984

50

Determination of the $\ion{Ni}{xviii}$ plasma recombination rate coefficient

Fogle, M., Badnell, N. R., Eklöw, N., Mohamed, T., Schuch, R.

Journal:

Astronomy and Astrophysics

Year:

2003

Language:

english

File:

PDF, 460 KB

english, 2003

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